The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2009
Filed:
Jun. 29, 2005
Applicants:
Francois DE Crecy, Seyssins, FR;
Bernard Diem, Echirolles, FR;
Inventors:
Francois De Crecy, Seyssins, FR;
Bernard Diem, Echirolles, FR;
Assignee:
Commissariat a l'Energie Atomique, Paris, FR;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 1/00 (2006.01); G01K 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A tightness testing method for a MEMS or small encapsulated component, the MEMS or small component being housed in a cavity of a carrier. The cavity being sealed and containing a gas having a different density to the density it would have if subjected to the pressure of the medium outside the cavity. The method measures the density of the gas contained in the cavity.
De Crecy, Francois. (2009). Tightness test for mems or for small encapsulated components (U.S. Patent No. 7572053). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7572053
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile