The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2009
Filed:
Jul. 28, 2005
Applicants:
Philip B. Cowan, Vancouver, WA (US);
Yifeng Wu, Vancouver, WA (US);
David W. Kinkley, Vancouver, WA (US);
Inventors:
Philip B. Cowan, Vancouver, WA (US);
Yifeng Wu, Vancouver, WA (US);
David W. Kinkley, Vancouver, WA (US);
Assignee:
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 29/393 (2006.01); B41J 29/38 (2006.01);
U.S. Cl.
CPC ...
Abstract
A multiple die printer may be calibrated by a method which includes receiving, for each die, optical density related measurements from a set of calibration targets printed on print media, each calibration target printed by nozzles of a single one of said multiple dies, the targets of each set of varying nominal optical densities, and creating linearization tables for each of said multiple dies.