The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2009
Filed:
Oct. 29, 2007
C. Harry Knowles, Hanover, NH (US);
Xiaoxun Zhu, Marlton, NJ (US);
Timothy Good, Clementon, NJ (US);
Tao Xian, Bensalem, PA (US);
Anatoly Kotlarsky, Churchville, PA (US);
Michael Veksland, Marlton, NJ (US);
Mark Hernandez, Bridgeton, NJ (US);
John Gardner, Mullica Hill, NJ (US);
Steven Essinger, Philadelphia, PA (US);
Patrick Giordano, Blackwood, NJ (US);
Sean Kearney, Hamilton, NJ (US);
Mark Schmidt, Williamstown, NJ (US);
John A. Furlong, Woodbury, NJ (US);
Nicholas Ciarlante, Woolwich Township, NJ (US);
Yong Liu, Suzhou, CN;
Jie Ren, Suzhou, CN;
Xi Tao, Suzhou, CN;
Jibin Liu, Suzhou, CN;
Ming Zhuo, Suzhou, CN;
Duane Ellis, Medford, NJ (US);
C. Harry Knowles, Hanover, NH (US);
Xiaoxun Zhu, Marlton, NJ (US);
Timothy Good, Clementon, NJ (US);
Tao Xian, Bensalem, PA (US);
Anatoly Kotlarsky, Churchville, PA (US);
Michael Veksland, Marlton, NJ (US);
Mark Hernandez, Bridgeton, NJ (US);
John Gardner, Mullica Hill, NJ (US);
Steven Essinger, Philadelphia, PA (US);
Patrick Giordano, Blackwood, NJ (US);
Sean Kearney, Hamilton, NJ (US);
Mark Schmidt, Williamstown, NJ (US);
John A. Furlong, Woodbury, NJ (US);
Nicholas Ciarlante, Woolwich Township, NJ (US);
Yong Liu, Suzhou, CN;
Jie Ren, Suzhou, CN;
Xi Tao, Suzhou, CN;
JiBin Liu, Suzhou, CN;
Ming Zhuo, Suzhou, CN;
Duane Ellis, Medford, NJ (US);
Metrologic INstruemtns, Inc., Blackwood, NJ (US);
Abstract
A POS-based digital image capturing and processing system for illuminating objects using automatic object detection and spectral-mixing illumination technique. The system comprises a coplanar illumination and imaging station for projecting at least one coplanar illumination and imaging plane into an imaging volume during object illumination and imaging operations. The coplanar illumination and imaging station includes an illumination subsystem for producing a first field of visible illumination from an array of visible VLDs, and producing a second field of invisible illumination from an array of infrared (IR) laser diodes (IR-LDs). Wherein the first and second fields of illumination spatially overlap and intermix with each other and are substantially coplanar with the FOV of the linear image sensing array. An automatic object detection subsystem automatically detects an object moving through the imaging volume, while an illumination control subsystem controls the relative power ratio (VIS/IR) of visible illumination and invisible illumination during system operation so as to minimize the amount of visible illumination energy required to capture sufficiently high-contrast images of said objects and successfully process the same.