The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2009
Filed:
Aug. 22, 2006
Applicant:
Takeshi Soeda, Kawasaki, JP;
Inventor:
Takeshi Soeda, Kawasaki, JP;
Assignee:
Fujitsu Limited, Kawasaki, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 1/24 (2006.01);
U.S. Cl.
CPC ...
Abstract
An energy beam is applied to an evaluation region of a sample, a phase distribution image of the energy beam transmitted to the sample in the evaluation region is obtained, and the obtained phase distribution image is analyzed, whereby a stress distribution in the evaluation region is measured. This measuring method measures a stress, based on a phase distribution image, whereby the stress can be measured irrespectively of a crystalline structure of an evaluation sample. A phase distribution image is used, whereby two-dimensional distribution images of the stress, density and refractive index can be obtained.