The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2009

Filed:

Apr. 19, 2006
Applicants:

James R Stimple, Santa Rosa, CA (US);

Jady Palko, Windsor, CA (US);

Inventors:

James R Stimple, Santa Rosa, CA (US);

Jady Palko, Windsor, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measurement system includes a clock recovery system and a measurement module coupled to the clock recovery system. The clock recovery system has an associated response characteristic. The clock recovery system receives an input signal and recovers a clock signal from the input signal. The measurement module is coupled to the clock recovery system and measures a phase error signal received from the clock recovery system, time-referenced to a trigger signal that is applied to the measurement module, where the phase error signal represents the phase difference between the input signal and the recovered clock signal. A processor applies the associated response characteristic to the measured phase error signal to determine the phase of the input signal.


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