The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2009

Filed:

May. 20, 2004
Applicants:

Martin Chen, Los Gatos, CA (US);

Shailesh P. Mane, San Jose, CA (US);

Gaurav Sharma, San Jose, CA (US);

Qi Wang, Cupertino, CA (US);

Dallan Clancy, Belmont, CA (US);

Mario Günter Rothenburg, Eppelheim, DE;

Uwe Kohler, Dielheim, DE;

Inventors:

Martin Chen, Los Gatos, CA (US);

Shailesh P. Mane, San Jose, CA (US);

Gaurav Sharma, San Jose, CA (US);

Qi Wang, Cupertino, CA (US);

Dallan Clancy, Belmont, CA (US);

Mario Günter Rothenburg, Eppelheim, DE;

Uwe Kohler, Dielheim, DE;

Assignee:

SAP AG, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for computer modeling the production process is disclosed. An integrated product and process engineering system may be a computer modeling system that models both a generic production process and a specific individual production process. The integrated product and process engineering system may store a time dependent process parameter related to the specific product design and organize the time dependent process parameters by product variants. The time dependent process parameter may have a parameter value and a start time. The time dependent process parameters may be input/output component consumption parameters, activity duration parameters, resource capacity consumption parameters, and activity scrap parameters.


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