The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2009

Filed:

Sep. 16, 2005
Applicants:

Fernando Javier D'amato, Niskayuna, NY (US);

Vivek Venugopal Badami, Schenectady, NY (US);

Jitendra Kumar, Mableton, GA (US);

Inventors:

Fernando Javier D'Amato, Niskayuna, NY (US);

Vivek Venugopal Badami, Schenectady, NY (US);

Jitendra Kumar, Mableton, GA (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 3/00 (2006.01); G01B 5/00 (2006.01); G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A degradation monitoring system including: a machine; a sensor affixed to the machine, the sensors measuring a operational parameters of the machine; a set of filters receptive of information about the machine from the sensors and the filters responsively generate status signals; and comparators for comparing the status signals to stored signals, wherein the comparators indicate at least one of a presence of degradation of the machine, or a cause of degradation of the machine.


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