The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2009

Filed:

Sep. 02, 2005
Applicants:

Michael E. Swanger, Shelby Township, MI (US);

John S. Agapiou, Rochester Hills, MI (US);

Robert J. Hogarth, Millington, MI (US);

Inventors:

Michael E. Swanger, Shelby Township, MI (US);

John S. Agapiou, Rochester Hills, MI (US);

Robert J. Hogarth, Millington, MI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/68 (2006.01); G06K 9/60 (2006.01); H04N 9/47 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system are provided for non-contact evaluation of a machined surface of a cast-metal part, including a vision-based porosity inspection station. A digital image of the machined surface is acquired, oriented and scaled to an XY coordinate system, filtered, and inverted. A second image is generated with known design surface features eliminated. Each pixel of the inverted digital image is XOR-compared with a corresponding pixel of the second image. Identified common surface features common to both images is analyzed statistically for conformance to a threshold. A defect is identified as any identified surface feature common to both images which exceeds the threshold. The system moves the part for further processing if a statistical analysis of defects indicates an acceptable component, and alternatively, removes the part from further processing if the analysis indicates a flawed component.


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