The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2009

Filed:

Feb. 05, 2004
Applicants:

Yoshio Tsukamoto, Kanagawa, JP;

Akira Kurachi, Tokyo, JP;

Inventors:

Yoshio Tsukamoto, Kanagawa, JP;

Akira Kurachi, Tokyo, JP;

Assignee:

Baldwin-Japan Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method comprises the step of reading multi level data of reference of each of colors from a printed paper on which images are printed to be good. The multi level data of reference are converted into two level data of reference so that two level data of images of reference can be reproduced in a memory from the two level data of reference. The method further comprises the step of reading multi level data of inspection of each of colors from a printed paper which is fed when inspecting. The multi level data of inspection are converted into two level data of inspection so that two level images of inspection can be reproduced in the memory from the two level data of inspection. The method further comprises the step of comparing the two level images of inspection with the two level images of reference for inspection of stained parts and blurred parts.


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