The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2009
Filed:
May. 08, 2007
Kejun Kang, Beijing, CN;
LI Zhang, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Haifeng HU, Beijing, CN;
Yuanjing LI, Beijing, CN;
Yinong Liu, Beijing, CN;
Guowei Zhang, Beijing, CN;
Ziran Zhao, Beijing, CN;
Yuxiang Xing, Beijing, CN;
Yongshun Xiao, Beijing, CN;
Kejun Kang, Beijing, CN;
Li Zhang, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Haifeng Hu, Beijing, CN;
Yuanjing Li, Beijing, CN;
Yinong Liu, Beijing, CN;
Guowei Zhang, Beijing, CN;
Ziran Zhao, Beijing, CN;
Yuxiang Xing, Beijing, CN;
Yongshun Xiao, Beijing, CN;
Tsinghua University, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Abstract
A cargo security inspection method and system based on spiral scanning, the method including: spirally scanning an inspected object at a first precision to obtain the transmission projection data; judging whether there is a suspect area in the inspected area; scanning at least one slice of the suspect area at a second precision wherein the second precision is greater than the first precision; reconstructing a tomographic image of the at least one slice; and using the reconstructed tomographic image to judge whether there is any dangerous article in the suspect area.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile