The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2009
Filed:
Jun. 10, 2005
Applicants:
Jiang Hsieh, Brookfield, WI (US);
Jianying LI, New Berlin, WI (US);
Xiangyang Tang, Waukesha, WI (US);
Inventors:
Jiang Hsieh, Brookfield, WI (US);
Jianying Li, New Berlin, WI (US);
Xiangyang Tang, Waukesha, WI (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention is directed to a method and system of blending data acquired from neighboring partial-scans. Data is acquired from an imaging volume in a series of fractional or partial-scans. Each partial-scan samples a fraction of the imaging volume. During reconstruction, data from the partial-scans are combined to compensate for the unsampled portion of the imaging volume that is experienced in any partial-scan alone.