The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2009

Filed:

Jan. 05, 2007
Applicants:

Mitsuo Ohashi, Yokohama, JP;

Yoshitoshi Ito, Ome, JP;

Inventors:

Mitsuo Ohashi, Yokohama, JP;

Yoshitoshi Ito, Ome, JP;

Assignee:

Spectratech Inc., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01B 11/02 (2006.01); G01J 3/45 (2006.01); G01J 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A light emission section includes light generators which are operated on the basis of drive signals from a controller so as to emit near infrared interferable light beams having different specific wavelengths to a light interference section. The light interference section includes a beam splitter having a low-reflection region. The beam splitter allows a most portion of the near infrared interferable light beams to propagate toward an object to be examined, and reflects a portion of the near infrared interferable light beams to a movable mirror. The beam splitter causes interference between measurement light reflected by the object and reference light reflected by the movable mirror, and the resultant interference light propagates to a light detection section. The light detection section receives the interference light and calculates predetermined information regarding the object by making use of the quantity distribution of the interference light. A display section displays the calculated information.


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