The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7570344 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 04, 2009

Filed:

Mar. 20, 2008
Applicants:

Shinichi Shima, Utsunomiya, JP;

Yasuo Takama, Utsunomiya, JP;

Inventors:

Shinichi Shima, Utsunomiya, JP;

Yasuo Takama, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 27/42 (2006.01); G03B 27/52 (2006.01);
U.S. Cl.
CPC ...
Abstract

An exposure apparatus which exposes a substrate via a liquid, comprises: a projection optical system configured to project a pattern of a reticle onto the substrate; a substrate stage configured to hold the substrate and move; a top plate which is arranged on the substrate stage and in which an opening is formed; and a measurement member which is arranged in the opening formed in the top plate arranged on the substrate stage, wherein a gap is formed between the top plate and the measurement member in a plane perpendicular to an optical axis of the projection optical system, and wherein the exposure apparatus satisfies the following formula: γ·cos θ·L+γ·cos θ·L+Pf·S<0.


Find Patent Forward Citations

Shima, Shinichi. (2009). Exposure apparatus and device manufacturing method (U.S. Patent No. 7570344). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7570344

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…