The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2009
Filed:
Sep. 21, 2006
A Hans Vija, Evanston, IL (US);
Eric G. Hawman, Schaumburg, IL (US);
A Hans Vija, Evanston, IL (US);
Eric G. Hawman, Schaumburg, IL (US);
Siemens Medical Solutions USA, Inc., Malvern, PA (US);
Abstract
A method for optimizing imaging dwell time during nuclear imaging. A fast pre-scan is conducted over the angular range of imaging, with equal dwell time at each position. A statistical sub-sampling is conducted over a region of interest to a desired fraction of the acquisition time. The statistical sub-sampling is used to simulate a varying dwell time tomographic dataset according to a profile pre-generated by an analysis of patient specific anatomic or functional information. Reconstructed data with equal dwell time and with simulated adaptive dwell time are constructed and compared to generate a difference image, a parameter of interest of which is evaluated. If the parameter of interest is within an acceptable level, the reduced dwell time for the given angular position is established; otherwise, the fraction is varied and the process is repeated. Once dwell times are computed for all view angles, a full scan is conducted.