The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2009
Filed:
Oct. 30, 2007
Hans-peter Von Arb, Greifensee, CH;
Jean-christophe Emery, Zürich, CH;
Daniel Reber, Madetswil, CH;
Cyrill Bucher, Uster, CH;
Stefan Buehler, Schwerzenbach, CH;
Hansruedi Kuenzi, Greifensee, CH;
Hans-Peter Von Arb, Greifensee, CH;
Jean-Christophe Emery, Zürich, CH;
Daniel Reber, Madetswil, CH;
Cyrill Bucher, Uster, CH;
Stefan Buehler, Schwerzenbach, CH;
Hansruedi Kuenzi, Greifensee, CH;
Mettler-Toledo AG, Greifensee, CH;
Abstract
A force-measuring device () with at least one housing () has an interior space and at least one force-measuring cell () installed therein. At least one parameter characterizing an existing high-frequency electromagnetic field is determined by a sensor () arranged in the interior space or a sensor arranged outside of the housing, the sensor being adapted for detecting high-frequency electromagnetic fields. After an electromagnetic field is detected and compared to a threshold value, a response action of the force-measuring device is triggered if the detected parameter value exceeds the threshold value.