The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2009

Filed:

Sep. 28, 2004
Applicants:

Ryo Aburatani, Chiba, JP;

Masanori Sera, Chiba, JP;

Yutaka Minami, Chiba, JP;

Inventors:

Ryo Aburatani, Chiba, JP;

Masanori Sera, Chiba, JP;

Yutaka Minami, Chiba, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C08F 8/18 (2006.01); C08F 8/46 (2006.01); C08F 8/00 (2006.01); C08F 10/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A higher olefin polymer having a polar group which is produced by subjecting to an incorporation reaction of a polar compound or halogen compound into a higher α-olefin polymer satisfying the requirements of the following (1) and (2), which is obtained by polymerizing one or more higher α-olefins having 10 or more carbon atoms or copolymerizing one or more higher α-olefins having 10 or more carbon atoms with one or more other olefins and a method for producing a higher olefin polymer having a polar group which is obtained by polymerizing one or more higher α-olefins having 10 or more carbon atoms or copolymerizing one or more higher α-olefins having 10 or more carbon atoms with one or more other olefins to form a higher α-olefins polymer satisfying the requirements of the following (1) and (2) and subsequently subjecting to an incorporation reaction of a polar compound or halogen compound into the higher α-olefin polymer. (1) The content of units of a higher α-olefins having 10 or more carbon atoms is 50 mol % or more. (2) A single peak X1 which is ascribed to the side chain crystallization and observed at 15 deg<2θ<30 deg in a wide-angle X-ray scattering intensity distribution is observed.


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