The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2009

Filed:

Dec. 03, 2004
Applicants:

Xiaoxun Zhu, Marlton, NJ (US);

Yong Liu, Suzhou, CN;

Ka Man AU, Philadelphia, PA (US);

Rui Hou, Suzhou, CN;

Hongpeng Yu, Tianjin, CN;

Xi Tao, Suzhou, CN;

Liang Liu, Suzhou, CN;

Wenhua Zhang, Suzhou, CN;

Anatoly Kotlarsky, Holland, PA (US);

Sankar Ghosh, Boothwyn, PA (US);

Michael Schnee, Aston, PA (US);

Pasqual Spatafore, Marlton, NJ (US);

Thomas Amundsen, Turnersville, NJ (US);

Sung Byun, Cherry Hill, NJ (US);

Mark Schmidt, Williamstown, NJ (US);

Garrett Russell, Wilmington, DE (US);

John Bonanno, Woodbury, NJ (US);

C. Harry Knowles, Morrestown, NJ (US);

Inventors:

Xiaoxun Zhu, Marlton, NJ (US);

Yong Liu, Suzhou, CN;

Ka Man Au, Philadelphia, PA (US);

Rui Hou, Suzhou, CN;

Hongpeng Yu, Tianjin, CN;

Xi Tao, Suzhou, CN;

Liang Liu, Suzhou, CN;

Wenhua Zhang, Suzhou, CN;

Anatoly Kotlarsky, Holland, PA (US);

Sankar Ghosh, Boothwyn, PA (US);

Michael Schnee, Aston, PA (US);

Pasqual Spatafore, Marlton, NJ (US);

Thomas Amundsen, Turnersville, NJ (US);

Sung Byun, Cherry Hill, NJ (US);

Mark Schmidt, Williamstown, NJ (US);

Garrett Russell, Wilmington, DE (US);

John Bonanno, Woodbury, NJ (US);

C. Harry Knowles, Morrestown, NJ (US);

Assignee:

Metpologic Instruments, Inc., Blackwood, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 7/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of reading bar code symbols comprising the steps of: (a) projecting an image cropping zone (ICZ) framing pattern within the FOV of an image sensing array during wide-area illumination and image capturing operation; (b) visually aligning an object to be imaged within the ICZ framing pattern; (c) forming and capturing an wide-area image of the entire FOV, which spatially encompasses the ICZ framing pattern aligned about the object to be imaged; (d) using automatic software-based image cropping algorithm to automatically crop the pixels within the spatial boundaries defined by the ICZ framing pattern, from those pixels contained in the entire wide-area image frame captured during step (c); and (e) automatically decode processing the image represented by the cropped image pixels in the ICZ framing pattern so as to read a 1D or 2D bar code symbol graphically represented therein.


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