The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2009
Filed:
Dec. 12, 2006
Applicants:
Richard C Dokken, San Ramon, CA (US);
Gerald S Chan, Saratoga, CA (US);
Takehiko Ishii, Yokohama, JP;
Inventors:
Richard C Dokken, San Ramon, CA (US);
Gerald S Chan, Saratoga, CA (US);
Takehiko Ishii, Yokohama, JP;
Assignee:
Inovys Corporation, Pleasanton, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11R 31/28 (2006.01); G06F 7/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A process for identifying the location of a break in a scan chain in real time as fail data is collected from a tester. Processing a test pattern before applying it on a tester provides a signature enabling a method for a tester to identify a scan cell which is stuck during the time the tester is operating on a device under test rather than accumulating voluminous test data sets for delayed offline analysis.