The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2009

Filed:

Oct. 26, 2006
Applicants:

John Gregory Favor, Scotts Valley, CA (US);

Seungyoon Peter Song, San Jose, CA (US);

Christopher P. Nelson, Santa Clara, CA (US);

Inventors:

John Gregory Favor, Scotts Valley, CA (US);

Seungyoon Peter Song, San Jose, CA (US);

Christopher P. Nelson, Santa Clara, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Managing speculative execution via groups of actions corresponding to atomic traces enables efficient processing of flag-related actions, as atomic traces advantageously enable single checkpoints of flags at trace boundaries. Flag restoration from checkpoints for trace aborts uses a flag checkpoint table to store flag checkpoints, each corresponding to an atomic trace. The table is accessed for flag restoration in response to a trace abort. In a first technique, a corresponding flag checkpoint is stored in response to trace renaming, and the flag checkpoints are updated as flags are modified. Flags are restored from the flag checkpoint corresponding to an aborted atomic trace. In a second technique, a corresponding flag checkpoint is allocated to an invalid state in response to trace renaming, and initialized on-demand when flags are first modified in accordance with the atomic trace. Flags are restored from the oldest flag checkpoint starting from an aborted atomic trace.


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