The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7567268 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 28, 2009

Filed:

Aug. 16, 2006
Applicant:

Hidenori Akamatsu, Kanagawa, JP;

Inventor:

Hidenori Akamatsu, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/47 (2006.01); B41J 2/435 (2006.01);
U.S. Cl.
CPC ...
Abstract

A light-emission control unit controls an emission of a light beam from a light-beam generating unit based on an input image signal. A light-beam scanning unit deflects the light beam in a main scanning direction and irradiates the deflected light beam on an image carrier. An anomalous-light emission detecting unit detects an anomalous light emission of the light-beam generating unit when there is no image signal input to the light-emission control unit. A control unit performs an error processing based on the detected anomalous light emission.


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Akamatsu, Hidenori. (2009). Image forming apparatus and abnormality detecting method (U.S. Patent No. 7567268). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7567268

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