The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2009

Filed:

Jan. 09, 2008
Applicants:

In-soo Park, Suwon-si, KR;

Young-soo Sohn, Gunpo-si, KR;

Inventors:

In-soo Park, Suwon-si, KR;

Young-soo Sohn, Gunpo-si, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03L 7/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for detecting a lock failure and correcting a duty cycle includes a lock failure detector configured to determine whether a first internal clock signal is locked to a second internal clock signal and to output a lock failure signal in response thereto, a duty cycle correction unit configured to correct a duty cycle of an external clock signal responsive to the lock failure signal and to output the duty-cycle-corrected external clock signal as the first internal clock signal, and a delay unit configured to generate the second internal clock signal by delaying the first internal clock signal.


Find Patent Forward Citations

Park, In-soo. (2009). Apparatus for detecting and preventing a lock failure in a delay-locked loop (U.S. Patent No. 7567103). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7567103

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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