The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2009
Filed:
Mar. 15, 2006
Zhaohui Tang, Bellevue, WA (US);
Donald M. Farmer, Woodinville, WA (US);
C. James Maclennan, Redmond, WA (US);
ZhaoHui Tang, Bellevue, WA (US);
Donald M. Farmer, Woodinville, WA (US);
C. James MacLennan, Redmond, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Systems and methods that cleanse data in Extract, Transform, Load environments (ETL), via employing an outlier detect component that is positioned in data pipeline to data warehouse(s). Such outlier detect component employs a cluster mining model to split data into normal and outlier data. Different predictive models can be employed to detect outliers in different data slices to enhance the accuracy of the predictions. In addition, a graphical user interface (GUI) enables a user to interact with cluster groups that are created and/or analyzed by the outlier detect component.