The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7565271 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 21, 2009

Filed:

Sep. 13, 2006
Applicants:

Denton Bramwell, Layton, UT (US);

Klinton Washburn, Willard, UT (US);

Inventors:

Denton Bramwell, Layton, UT (US);

Klinton Washburn, Willard, UT (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A graphical user interface for a quality analysis computer program includes a first display area for displaying graphical representations of statistical data and a second display area containing a tree representation of a quality analysis project. The tree representation may include one or more quality analysis project steps, one or more statistical tool categories associated with the one or more quality analysis project steps, and one or more statistical tools associated with the one or more statistical tool categories.


Find Patent Forward Citations

Bramwell, Denton. (2009). Quality analysis method and program (U.S. Patent No. 7565271). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7565271

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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