The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2009
Filed:
Feb. 14, 2006
Hongsee Yam, Singapore, SG;
Teck Heng Lim, Singapore, SG;
Hwaliang NG, Singapore, SG;
Timothy Chinsoon Yoap, Singapore, SG;
Hongsee Yam, Singapore, SG;
Teck Heng Lim, Singapore, SG;
Hwaliang Ng, Singapore, SG;
Timothy ChinSoon Yoap, Singapore, SG;
Seagate Technology, LLC, Scotts Valley, CA (US);
Abstract
A data analysis system analyzes data sets that are characterized by a wide variety of probability density functions (PDFs), and also analyzes mixed populations, i.e., a single data set containing subsets of data that each fit a different distribution. The data analysis system receives quality control data from a product manufacturing or product testing floor, determines whether the data is a mixed population, and fits the data with a variety of PDFs. The data analysis system selects the best fitting PDF based on statistical characteristics calculated for each fitted PDF. The data analysis system generates performance capability parameters based on the best fitting PDF, and may generate reports illustrating the performance capability parameters. The data analysis system also adjusts statistical control limits to provide a more reliable process trigger and control plan. In this manner, the data analysis system may more accurately report product performance.