The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2009
Filed:
Jan. 31, 2007
Joachim Baumann, München, DE;
Christian David, Lauchringen, DE;
Martin Engelhardt, München, DE;
Jörg Freudenberger, Eckental, DE;
Eckhard Hempel, Fürth, DE;
Martin Hoheisel, Erlangen, DE;
Thomas Mertelmeier, Erlangen, DE;
Franz Pfeiffer, Brugg, CH;
Stefan Popescu, Erlangen, DE;
Manfred Schuster, München, DE;
Joachim Baumann, München, DE;
Christian David, Lauchringen, DE;
Martin Engelhardt, München, DE;
Jörg Freudenberger, Eckental, DE;
Eckhard Hempel, Fürth, DE;
Martin Hoheisel, Erlangen, DE;
Thomas Mertelmeier, Erlangen, DE;
Franz Pfeiffer, Brugg, CH;
Stefan Popescu, Erlangen, DE;
Manfred Schuster, München, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A focus-detector arrangement of an X-ray apparatus is disclosed for generating projective or tomographic phase contrast recordings with a phase grating. According to at least one embodiment of the invention, in the gaps between its bars, the phase grating includes a filler material whose linear attenuation coefficient in the relevant energy range is greater than that of the bars. The height of the filler material in the gaps is dimensioned on the one hand so that the X-radiation with the energy used for measuring the phase shift generates a phase shift in the X-radiation such that, after the phase grating, the rays which pass through the bars are phase shifted by one half wavelength relative to the rays which pass through the gaps with the filler material. Further, the height of the filler material in the gaps on the other hand is dimensioned so that the attenuation of the X-radiation, at least in relation to the energy used for measuring the phase shift, is the same when passing through the bars and when passing through the filler material.