The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2009

Filed:

Jan. 26, 2005
Applicants:

Ikuo Matsumoto, Mito, JP;

Hiroshi Tabata, Mito, JP;

Kenji Tokui, Hitachinaka, JP;

Kazuo Yonehara, Hitachinaka, JP;

Kenichi Shimomai, Mito, JP;

Inventors:

Ikuo Matsumoto, Mito, JP;

Hiroshi Tabata, Mito, JP;

Kenji Tokui, Hitachinaka, JP;

Kazuo Yonehara, Hitachinaka, JP;

Kenichi Shimomai, Mito, JP;

Assignee:

Victor Company of Japan, Ltd., Kanagawa-Ken, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

A phase-change optical storage medium has a substrate, and a recording layer, to be recorded on which is at least one recorded mark representing information to be recorded by irradiating a recording light beam onto the recording layer in accordance with a recording pulse pattern of recording pulses rising from an erasing power and formed between a recording power larger than the erasing power and a bottom power smaller than the erasing power and of erasing pulses rising from the bottom power to the erasing power. The expressions (1) and (2): 1.00<(R/R)<1.15 . . . (1), 1.05<(R/R)<1.20 . . . (2) are satisfied for the recording layer, in which Ris a reflectivity exhibited by an un-recorded section of the recording layer, on which no data has ever been recorded, when irradiated with a reproducing light beam, Ris a reflectivity exhibited by the un-recorded section when irradiated with the reproducing light beam, after irradiated once with the recording light beam in accordance with the recording pulse pattern, and Ris a reflectivity exhibited by the un-recorded section when irradiated with the reproducing light beam, after irradiated nine times with the recording light beam in accordance with the recording pulse pattern.


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