The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2009
Filed:
Oct. 18, 2007
Yoshihiro Kawano, Hachioji, JP;
Isao Ishibe, Mishima, JP;
Yoshihisa Tanikawa, Chuo-ku, JP;
Atsuhiro Tsuchiya, Hachioji, JP;
Yoshihiro Kawano, Hachioji, JP;
Isao Ishibe, Mishima, JP;
Yoshihisa Tanikawa, Chuo-ku, JP;
Atsuhiro Tsuchiya, Hachioji, JP;
Olympus Corporation, Tokyo, JP;
Abstract
A focusing method for an examination apparatus that can quickly and easily perform focusing for fluoroscopy is provided. The focusing method, for an examination apparatus that can observe fluorescence emitted from a specimen, includes a first step of irradiating the specimen with light via an objective lens to generate reflected light and fluorescence; a second step of performing focusing with respect to the surface of the specimen using the reflected light from the specimen; and a third step of performing focusing for the fluorescence based on the focal position of the specimen surface in the second step.