The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2009
Filed:
Jan. 04, 2006
Zahid F. Mian, Loudonville, NY (US);
Jeremy C. Mullaney, Troy, NY (US);
Robert Macallister, Mechanicville, NY (US);
Thomas J. Schneider, Nashua, NH (US);
Zahid F. Mian, Loudonville, NY (US);
Jeremy C. Mullaney, Troy, NY (US);
Robert MacAllister, Mechanicville, NY (US);
Thomas J. Schneider, Nashua, NH (US);
International Electronic Machines Corp., Troy, NY (US);
Abstract
A solution for optically evaluating a wheel along at least one circumference of the wheel is provided. Image data is obtained while the wheel moves along a path having a length of at least one circumference of the wheel. The path and/or wheel can be illuminated to enhance the resulting image data. One or more attributes of the wheel are measured based on the image data. The attributes can then be used to detect one or more defects in the wheel. In one embodiment, the wheel is a rail wheel, and a rail segment is illuminated. The rail can be specially configured to enhance a contrast between the rail and the rail wheel and/or to provide a consistent path for the rail wheel to travel.