The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2009
Filed:
Jul. 01, 2008
Applicants:
David Ernest Call, Folsom, CA (US);
Hardayal Singh Gill, Palo Alto, CA (US);
Inventors:
David Ernest Call, Folsom, CA (US);
Hardayal Singh Gill, Palo Alto, CA (US);
Assignee:
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/09 (2006.01); G11B 5/33 (2006.01); G11B 5/39 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for testing magnetic heads formed on a wafer to detect the presence of thermal induced popcorn noise resulting from thermal fly height control. The method includes performing a quasi test on a magnetic head, the quasi test being performed over 400 or more cycles of magnetic field application. For additional test accuracy, the write head can be cycled while 400 or more cycles of magnetic field are generated.