The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2009

Filed:

Oct. 30, 2006
Applicants:

Akira Miyatake, Niigata-ken, JP;

Keitaro Kikuchi, Niigata-ken, JP;

Tomonari Hosaka, Niigata-ken, JP;

Inventors:

Akira Miyatake, Niigata-ken, JP;

Keitaro Kikuchi, Niigata-ken, JP;

Tomonari Hosaka, Niigata-ken, JP;

Assignee:

TDK Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 23/00 (2006.01); G01K 5/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of efficiently inspecting a thin film magnetic head is provided. The method including holding a slider bar having a plurality of the thin film magnetic head elements in a row by an inspecting holding jig made of a nonmagnetic material; loading the slider bar held by the inspecting holding jig to a sampling placing part of a scanning electron microscope; and sequentially executing shape inspection of the plurality of thin film magnetic head elements on the slider bar by the scanning electron microscope.


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