The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2009

Filed:

Aug. 15, 2007
Applicants:

Mingda Wang, Fremont, CA (US);

Charles A. Fancher, San Francisco, CA (US);

Felician Muntean, Danville, CA (US);

Urs Steiner, Sunnyvale, CA (US);

Inventors:

Mingda Wang, Fremont, CA (US);

Charles A. Fancher, San Francisco, CA (US);

Felician Muntean, Danville, CA (US);

Urs Steiner, Sunnyvale, CA (US);

Assignee:

Varian, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

Sample material ionized in a sample receiving chamber is flowed into a sample conduit. Drying gas may also flow into the sample conduit and may be heated. The pressure and length of the sample conduit may be provided according to the product 50 or greater Torr−cm. The sample conduit may include a turn. The sample conduit may lead to an ion extraction chamber at which a sampling orifice may lead to a mass spectrometer. The diameter of the sample conduit may be larger than the diameter of the sampling orifice. An electrical field may be applied in the ion extraction chamber to slow incoming ions. A voltage jump may be applied to the sample conduit.


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