The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2009
Filed:
Jun. 11, 2003
Applicant:
Andreas Heimdal, Oslo, NO;
Inventor:
Andreas Heimdal, Oslo, NO;
Assignee:
GE Medical Systems Global Technology Company LLC, Waukesha, WI (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
System and method for automatically measuring the delay of tissue motion and deformation. For example, asynchrony may be measured between the left and right ventricles and within the left ventricle. A measurement feature may be defined by default or obtained using a user input. A reference time and a search interval are identified. The search interval may be based on the reference time, or input or modified by a user. A time delay of the measurement feature within the search interval is calculated for each sample. At least one color is assigned to the samples corresponding to the calculated time delay.