The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7562572 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 21, 2009

Filed:

Dec. 27, 2005
Applicants:

Hee-cheon You, Pohang-si, KR;

Sung-ha Park, Daejeon, KR;

Sung-tae Kim, Pohang-si, KR;

Gi-no Lee, Pohang-si, KR;

O-chae Kwon, Pohang-si, KR;

Young-kyun Kong, Jeollanam-do, KR;

Ki-hyo Jung, Pohang-si, KR;

Inventors:

Hee-cheon You, Pohang-si, KR;

Sung-ha Park, Daejeon, KR;

Sung-tae Kim, Pohang-si, KR;

Gi-no Lee, Pohang-si, KR;

O-chae Kwon, Pohang-si, KR;

Young-kyun Kong, Jeollanam-do, KR;

Ki-hyo Jung, Pohang-si, KR;

Assignee:

Postech Foundation, Pohang, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A63B 21/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is an apparatus for measuring force applied to a hand when a worker works in an industrial field. The measuring apparatus includes a glove with a plurality of sensors on the palm side, a case with a band, and a register for receiving and registering measurement signals obtained in the sensors, the register being mounted in the case.


Find Patent Forward Citations

You, Hee-cheon. (2009). Apparatus for measuring force applied by the hand, analyzing apparatus, and system (U.S. Patent No. 7562572). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7562572

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