The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2009

Filed:

Jul. 09, 2004
Applicants:

David E. Huddleston, Lakewood, OH (US);

Ronald J. Cass, Cleveland Heights, OH (US);

Zhuo Meng, Broadview Heights, OH (US);

Yoh-han Pao, Cleveland Heights, OH (US);

Qian Yang, Broadview Heights, OH (US);

Xinyu Mao, Sagamore Hills, OH (US);

Inventors:

David E. Huddleston, Lakewood, OH (US);

Ronald J. Cass, Cleveland Heights, OH (US);

Zhuo Meng, Broadview Heights, OH (US);

Yoh-Han Pao, Cleveland Heights, OH (US);

Qian Yang, Broadview Heights, OH (US);

Xinyu Mao, Sagamore Hills, OH (US);

Assignee:

Computer Associates Think, Inc., Islandia, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06N 3/00 (2006.01); G06N 3/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for automated feature selection is provided. One or more initial sets of features are generated and evaluated to determine quality scores for the feature sets. Selected ones of the feature sets are (i) chosen according to the quality scores and modified to generate a generation of modified feature sets, (ii) the modified feature sets are evaluated to determine quality scores for the modified feature sets, and (i) and (ii) are repeated until a modified feature set is satisfactory.


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