The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2009
Filed:
Apr. 20, 2007
Applicant:
Robin A. Bordow, Petaluma, CA (US);
Inventor:
Robin A. Bordow, Petaluma, CA (US);
Assignee:
Agilent Technologies, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus for making multiple independent measurements of events from multiple measurement setups entered at a single time. A measurement instrument receives N measurement setups to make N measurements of an input signal, where N is an integer greater than or equal to one. A memory is divided into N partitions, each of the N partitions corresponding to one of the N measurements. A first measurement is run on the input signal, the first measurement selected from the N measurements. The data from the first measurement is stored in a first partition selected from the N partitions.