The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2009
Filed:
Feb. 04, 2005
Yuri Owechko, Newburry Park, CA (US);
Narayan Srinivasa, Thousand Oaks, CA (US);
Swarup Medasani, Thousand Oaks, CA (US);
Riccardo Boscolo, Culver City, CA (US);
Yuri Owechko, Newburry Park, CA (US);
Narayan Srinivasa, Thousand Oaks, CA (US);
Swarup Medasani, Thousand Oaks, CA (US);
Riccardo Boscolo, Culver City, CA (US);
HRL Laboratories, LLC, Malibu, CA (US);
Abstract
A method, an apparatus, and a computer program product for three-dimensional shape estimation using constrained disparity propagation are presented. An act of receiving a stereoscopic pair of images of an area occupied by at least one object is performed. Next, pattern regions and non-pattern regions are detected in the images. An initial estimate of śpatial disparities between the pattern regions in the images is generated. The initial estimate is used to generate a subsequent estimate of the spatial disparities between the non-pattern regions. The subsequent estimate is used to generate further subsequent estimates of the spatial disparities using the disparity constraints until there is no change between the results of subsequent iterations, generating a final estimate of the spatial disparities. A disparity map of the area occupied by at least one object is generated from the final estimate of the three-dimensional shape.