The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2009
Filed:
Apr. 30, 2004
Jonathan James Ashley, Los Gatos, CA (US);
Ching-fu Wu, Santa Clara, CA (US);
Kaichi Zhang, San Jose, CA (US);
Jonathan James Ashley, Los Gatos, CA (US);
Ching-Fu Wu, Santa Clara, CA (US);
Kaichi Zhang, San Jose, CA (US);
Agere Systems Inc., Allentown, PA (US);
Abstract
A method and apparatus are disclosed for detecting a synchronization mark in a received signal. The received signal is processed to compensate for a DC bias in the received signal, such as subtracting an average of a block of received samples from each sample in the block. A distance metric, such as a sum of square differences, is computed between the DC compensated received signal and an ideal version of the received signal expected when reading the synchronization mark. The synchronization mark is detected if the distance metric satisfies predefined criteria. The ideal version of the received signal can optionally be processed to compensate for a DC bias in the synchronization mark. A search for the synchronization mark search can be limited to time cycles that match a known phase.