The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2009
Filed:
Jul. 21, 2006
Applicants:
Ralf Wolleschensky, Jena, DE;
Hans-jürgen Dobschal, Kleinromstedl, DE;
Robert Brunner, Jena, DE;
Inventors:
Assignee:
Carl Zeiss MicroImaging GmbH, Jena, DE;
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/02 (2006.01); G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
A microscope objective system including an objective, which includes an illumination beam path via which illumination radiation from a source is directed onto an object to be examined, as well as a partial detection beam path surrounding at least part of the illumination beam path and, together with the illumination beam path, forms a detection beam path via which radiation to be detected and coming from the sample is guided towards a detector.