The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2009
Filed:
Oct. 19, 2004
Joerg-michael Funk, Jena, DE;
Ralf Wolleschensky, Apolda, DE;
Joerg Steinert, Jena, DE;
Carl Zeiss MicroImaging GmbH, Jena, DE;
Abstract
In a confocal laser scanning microscope with an illuminating configuration (), which provides an illuminating beam for illuminating a specimen region (), with a scanning configuration (), which guides the illuminating beam over the specimen while scanning, and with a detector configuration (), which via the scanning configuration () images the illuminated specimen region () by means of a confocal aperture () on to at least one detector unit (), it is provided that the illuminating configuration () of the scanning configuration () provides a line-shaped illuminating beam, that the scanning configuration () guides the line-shaped illuminating beam over the specimen f while scanning and that the confocal aperture is designed as a slit aperture () or as a slit-shaped region () of the detector unit () acting as a confocal aperture.