The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2009
Filed:
Sep. 18, 2006
David J Brady, Durham, NC (US);
Bob D Guenther, Cary, NC (US);
Michael E Gehm, Durham, NC (US);
Scott T Mccain, Durham, NC (US);
David J Brady, Durham, NC (US);
Bob D Guenther, Cary, NC (US);
Michael E Gehm, Durham, NC (US);
Scott T McCain, Durham, NC (US);
Duke University, Durham, NC (US);
Abstract
An optical spectrometer and/or a method of optical spectroscopy is described herein. One exemplary spectrometer includes a planar spectral filter, a dispersion system, and a detector array having at least two dimensions. The planar spectral filter filters incident light to generate a plurality of wavelength dependent spatial patterns. The dispersion system disperses the spatial patterns along at least one dimension in a wavelength dependent fashion onto the detector array. As a result, spatial patterns corresponding to different wavelengths are centered at different locations on the detector array. The dispersed spatial patterns superimpose at the detector array in an offset but overlapping relationship, creating an asymmetric image that facilitates the spectral analysis of a wide range of light sources, including diffuse or spectrally complex light sources.