The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2009
Filed:
Jun. 27, 2007
Bruno Napierala, Le Cannet, FR;
Cyril Degrelle, Mandelieu, FR;
Xavier Leyre, Opio, FR;
Suzanne Abadie, Cannes la Bocca, FR;
Bruno Napierala, Le Cannet, FR;
Cyril Degrelle, Mandelieu, FR;
Xavier Leyre, Opio, FR;
Suzanne Abadie, Cannes la Bocca, FR;
Thales, , FR;
Abstract
The invention relates to a satellite metrology system for satellite formation flight comprising at least one reference satellite (SR) and one secondary satellite (SS). In the reference satellite, an optical source (SO) emits a light beam intended to illuminate the secondary satellite (SS) and a set of light detectors (CCD) detects the light reflected by the secondary satellite. A measuring circuit (CI) is used for detecting the detector or detectors that receive the light from the secondary satellite. In the secondary satellite (SS) at least one reflector (RR) receives the illumination light from the reference satellite and reflects it towards the set of detectors (CCD) of the reference satellite.