The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2009
Filed:
Jul. 26, 2004
Raymond E. Garvey, Iii, Loudon, TN (US);
Michael D. Rich, Powell, TN (US);
Anthony J. Hayzen, Knoxville, TN (US);
Mark Granger, Knoxville, TN (US);
Raymond E. Garvey, III, Loudon, TN (US);
Michael D. Rich, Powell, TN (US);
Anthony J. Hayzen, Knoxville, TN (US);
Mark Granger, Knoxville, TN (US);
CSI Technology, Inc., Wilmington, DE (US);
Abstract
A method and apparatus for inspecting equipment using focal plane array imaging sensor data and dynamic sensor data. Methods involve capturing focal plane array imaging sensor data using a focal plane array imaging sensor such as an infrared camera or a visible camera, or acquiring imaging sensor data from an electronic data storage source, and involve capturing dynamic sensor data, such as vibration or ultrasonic data using a dynamic sensor such as an accelerometer or ultrasound system. Methods also provide for analyzing imaging and dynamic sensor data using such techniques as thermography and fast fourier transformation. Apparatuses include a portable instrument with sensor interfaces for collecting imaging sensor data and dynamic sensor data. A sensor suite is provided that includes vibration sensor, sonic sensors, ultrasonic sensors, oil sensors, flux sensors and current sensors. A base station is included to collect and analyze data from one or more portable instruments.