The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2009

Filed:

Sep. 23, 2004
Applicant:

Menachem Margaliot, Bnei Brak, IL;

Inventor:

Menachem Margaliot, Bnei Brak, IL;

Assignee:

Soreq Nuclear Research Center, Nahal Soreq, Yavne, IL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/04 (2006.01); G01V 8/00 (2006.01); G01V 3/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for detection of an object, the method including irradiating a target with two electromagnetic wave energy beams, a first beam at a first frequency and a second beam at a second frequency, the first frequency being lower than the second frequency, both beams being polarized in a first direction, and determining a presence of an object by analyzing reflections of the first and second beams, wherein if there is a dominant reflection polarization in the first direction for both the first and second frequencies, then the target is considered not to have the object, and if there is a dominant reflection polarization in the first direction for only one of the first and second frequencies and a depolarized reflection at the other of the first and second frequencies, then the target is considered to have the object.


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