The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2009
Filed:
Jun. 15, 2005
Shunji Ishio, Akita, JP;
Hitoshi Saito, Akita, JP;
Shunji Ishio, Akita, JP;
Hitoshi Saito, Akita, JP;
Japan Science and Technology Agency, Kawaguchi-shi, JP;
Abstract
A coersive force distribution analyzing, apparatus applies a magnetic field substantially perpendicularly to a sample including a perpendicularly magnetically recordable magnetic thin film. While tow-dimensionally moving the sample, the coersive force distribution analyzing apparatus generates a magnetic flux detection signal in response to a leakage flux generated in a magnetic domain on a sample surface. The apparatus applies, to the sample, a first external magnetic field and a second external magnetic field respectively corresponding to a first threshold and a second threshold selected from a hysteresis characteristic corresponding to average magnetization of the sample. This results in first magnetic domain image data and second magnetic domain image data. The apparatus uses the first and second thresholds to binarize the first and second image data to generate a first coersive force distribution pattern corresponding to the difference between the binarized first and second image data.