The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2009

Filed:

Jan. 30, 2008
Applicants:

Hiroyuki Kimura, Hachioji, JP;

Kenichi Kusaka, Hachioji, JP;

Katashi Ishihara, Bethlehem, PA (US);

Inventors:

Hiroyuki Kimura, Hachioji, JP;

Kenichi Kusaka, Hachioji, JP;

Katashi Ishihara, Bethlehem, PA (US);

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a scanning laser microscope including a first laser light source for emitting ultrashort pulsed laser light; a scanning unit for two-dimensionally scanning the ultrashort pulsed laser light on a specimen; a second laser light source for emitting continuous laser light; an irradiation-position adjusting unit for performing two-dimensional adjustment of an irradiation position of the continuous laser light on the specimen; an objective lens for focusing the ultrashort pulsed laser light and the continuous laser light onto the specimen and for collecting fluorescence generated in the specimen; a light-detecting unit for detecting the fluorescence, which is split off from a light path between the objective lens and the scanning unit; and a continuous-laser-light switching unit for permitting radiation of the continuous laser light when the light-detecting unit is not detecting required fluorescence from the specimen on the basis of the ultrashort pulsed laser light.


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