The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2009
Filed:
Oct. 16, 2000
Marko K. Baller, Santa Barbara, CA (US);
Juergen Fritz, Karlsruhe, DE;
Christoph Gerber, Richterswil, CH;
James Gimzewski, Santa Monica, CA (US);
Hans Peter Lang, Reinach, CH;
Marko K. Baller, Santa Barbara, CA (US);
Juergen Fritz, Karlsruhe, DE;
Christoph Gerber, Richterswil, CH;
James Gimzewski, Santa Monica, CA (US);
Hans Peter Lang, Reinach, CH;
International Business Machines Corporation, Armonk, NY (US);
Universitat Basel, , CH;
Abstract
Sensor system () for detecting a target substance in a reference liquid, comprising a measurement cantilever () being functionalized by application of a first coating to one of the measurement cantilever's surfaces, whereby this first coating is sensitive to the target substance. In addition, the system () comprises a reference cantilever () with a reference coating on one of the reference cantilever's surfaces, whereby this reference coating is less sensitive to the target substance than the first coating. Both cantilevers are arranged such that they can be exposed in a reference step to the reference liquid and in a detection step to the reference liquid with the target substance. A detector unit () is employed for determining the difference in the deflection of the measurement cantilever () and the reference cantilever () during the reference step and the detection step.