The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2009

Filed:

Dec. 09, 2005
Applicants:

Simon Widdowson, Palo Alto, CA (US);

Niranjan Damera-venkata, Palo Alto, CA (US);

Nelson Liang an Chang, Palo Alto, CA (US);

Inventors:

Simon Widdowson, Palo Alto, CA (US);

Niranjan Damera-Venkata, Palo Alto, CA (US);

Nelson Liang An Chang, Palo Alto, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 21/00 (2006.01); G03B 21/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method comprising analyzing a portion of image data to identify a characteristic of the portion of the image data and determining an algorithm based on the characteristic is provided. The algorithm is configured to generate at least first and second image data subsets with distortion using the image data such that the first and the second image data subsets are configured to cause an image corresponding to the image data to be reproduced without the distortion in response to being simultaneously displayed with first and second projection devices, respectively.


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