The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2009
Filed:
Nov. 01, 2007
Kazunari Shimizu, Gamagori, JP;
Masanao Fujieda, Toyohashi, JP;
Kazunari Shimizu, Gamagori, JP;
Masanao Fujieda, Toyohashi, JP;
Nidek Co., Ltd., Gamagori-shi, JP;
Abstract
An ophthalmic measurement apparatus capable of outputting correction data (objective values) for a patient's eye as approximate as possible to subjective values includes an optical system for projecting a measurement target onto a fundus and detecting an image of the target reflected therefrom using a photoelectric element so as to obtain measurement data on eye refractive power distribution or wavefront aberration, an optical system for photographing an anterior-segment including a pupil using an image-pickup element, a device which detects a size of a pupil area by image processing, and a device which obtains a spherical power, an astigmatic power, and an astigmatic axial angle based on the data within a given area smaller than the pupil area when the detected size is larger than a reference size, and obtains the three values based on the data within the pupil area when the detected size is smaller than the reference size.