The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2009

Filed:

Nov. 15, 2005
Applicants:

Cheol-hong Park, Seoul, KR;

Sang-seok Kang, Suwon-si, KR;

Inventors:

Cheol-Hong Park, Seoul, KR;

Sang-Seok Kang, Suwon-si, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 7/00 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test apparatus for a semiconductor memory device applies a test input pattern to the semiconductor memory device to produce a test output pattern. The test apparatus compares the test output pattern to an expected output pattern using a plurality of comparators to determine whether the semiconductor memory device is defective. The plurality of comparators are respectively controlled by a respective plurality of strobe signals having relative phase delays so that the test output pattern is compared to the expected output pattern at different times.


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