The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2009
Filed:
May. 25, 2006
Heinz Mattes, Munich, DE;
Sebastian Sattler, Munich, DE;
Heinz Mattes, Munich, DE;
Sebastian Sattler, Munich, DE;
Infineon Technologies AG, Neubiberg, DE;
Abstract
A test device contains a data pattern generator for providing a delta-sigma-modulated data stream sampled with a sampling frequency fat its output. A phase modulator generates a test clock subjected to jitter and having the clock frequency fat its output. The output of the data pattern generator is connected to a terminal for connection to a data input of a semiconductor component to be tested. The output of the phase modulator is connected to a terminal for connection to a clock input of a semiconductor component to be tested. An evaluation device determines the jitter parameters of the input signal at the input of the data device from the low-frequency component of the input signal. In this case, the low-frequency component contains only frequency components of frequencies which are less than half the sampling frequency f/2.